Download Data converters for wireless standards by Chunlei Shi PDF
By Chunlei Shi
This textual content provides the layout of knowledge converters for rising criteria and introduces the underlying circuit layout rules. it really is a great reference for IC and combined sign designers, layout managers and venture leaders in undefined, fairly these within the instant semiconductor undefined.
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33, no. 7, pp. 987–997, July 1998.  K. S. Vaucher, “A Global Car Radio IC with Inaudible Signal Quality Checks,” in IEEE International Solid-State Circuits Conf. (ISSCC), 1998, pp. 130–131. S. Vaucher, “An Adaptive PLL Tuning System Architecture Combining High Spectral Purity and Fast Settling Time,” IEEE Journal of Solid-State Circuits, vol. 35, no. 4, pp. 490–502, Apr. 2000. S. Vaucher and Z. 8GHz Programmable Divider in Standard CMOS Technology,” in Proc. of the 25th European Solid-State Circuits Conference (ESSCIRC), 1999, vol.
The common concepts of undamped natural frequency and damping factor originated in the analysis of second-order systems are therefore not used in this work. We then proceed with an analysis of the spectral purity performance of a single-loop PLL, namely spurious reference breakthrough and phase noise performance. A linear time-continuous phase noise model is derived which is used in the remaining of the book to evaluate the phase noise of different configurations. The quantitative insights of this section can be used to quantify the “common-place” knowledge that, for optimization of the spectral purity performance, the reference frequency should be chosen as high as possible.
1858–1865, Dec. 1997. E. Larson, “Integrated Circuit Technology Options for RF IC’s— Present Status and Future Directions,” IEEE Journal of Solid-State Circuits, vol. 33, no. 3, pp. 387–399, Mar. 1998. M. Gardner, Phase-lock Techniques, Wiley, New York, 2nd. edition, 1979. L. Rohde, RF and Microwave Digital Frequency Synthesizers, Wiley, New York, 1997. L. , “The Heterodyne Receiving System, and Notes on the Recent Arlington-Salem Tests,” Proceedings of the IRE, vol. 1, pp. 75– 102, July 1913, Reprinted in Proceedings of the IEEE, Vol.